Fullerene (C-60) monolayer and multilayer thin films deposited on the Si(111)-7 X 7 surface have been investigated by non-contact atomic force microscopy (NC-AFM). Molecular-like features on the monolayer film and individual molecules on the crystalline islands of the multilayer films have been successfully resolved. We discuss the structures of C-60 thin films and the mechanisms of some observed artifacts. Furthermore, a contact potential difference (CPD) between the crystalline islands and the monolayer region was clearly observed.