화학공학소재연구정보센터
Applied Surface Science, Vol.157, No.4, 233-238, 2000
Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy
We have used non-contact atomic force microscopy (NC-AFM) to study TiO2(110), identifying a row with twice the thickness of a TiO2(110)1 X 2 row. This can be explained by a [1 (1) over bar 0] extension of the added row model of TiO2(110)1 X 2. In the [001] direction, this reconstruction narrows into a 1 X 2 row giving strong evidence that the two structures are very closely related. For the TiO2(100) surface, we present NC-AFM data which supports the intermediate 1 X 3-beta model previously proposed on the basis of an STM experiment.