Optical properties of ZnTe films, deposited by thermal evaporation of Zn and Te sources, were studied in the range of 400-2000 nm by UV-VIS-NIR spectrophotometer. Variations of refractive index with incident photon energy are fitted to a single oscillator model. Optical band gap and X-ray diffraction (XRD) have been reported for ZnTe films formed at substrate temperature of 300 degrees C with different evaporation rates.