The characteristics of interaction between C-60 molecules and Si(111)-7 x 7, Ag/Si(111)-root3 x root3 R30 degrees and layered material MoS2 surfaces have been investigated using electron-energy-loss spectroscopy (EELS), The EEL spectrum of C-60/Si(111)-7 x 7 shows a new peak at loss energy of 2.7 eV. This indicates the existence of charge transfer from the substrate to C-60 molecules. The EEL spectrum of a C-60 monolayer film grown on a cleaved surface of MoS2 is almost the same as that of bulk C-60 The EEL spectrum of a C-60 monolayer film on an Ag/Si(111) surface is quite different from that on a clean Si(111)-7 x 7 surface, although the films on those substrates have the same epitaxial arrangement. Furthermore, intensities of energy-loss peaks of C-60/Ag/Si(111) are slightly smaller than those of C-60/MoS2 in spite of having the same loss-energy. This suggests that the interaction between C-60 molecules and the Ag/Si(111) surface is stronger than that between C-60 molecules and the MoS2 surface.