Highly conductive and transparent ZnO thin films were prepared by atmospheric pressure CVD on glass substrates in the temperature range from 375 to 475 degreesC. Aluminium acetylacetonate or gallium acetylacetonate were used as the dopant source of group III element. The resistivity of the films critically depends on the amount of dopants and changes in a range of 10(-1) to 10(-3) Ohm cm. The lowest resistivity of 2.0 x 10-3 Ohm cm was obtained in the Ga-doped films deposited at the substrate temperature of 425 degreesC. X-ray diffraction results show that all deposited films were polycrystalline in nature with (002) preferred orientation. The electron concentration and Hall mobility of the film with the lowest resistivity are 5.9 x 10(19) cm(-3) and 31 cm(2) V-1 s, respectively.