ZnTe thin films, prepared by two-sourced evaporation of zinc and tellurium, were immersed in Cu(NO3)(2)-H2O solution for different time periods. The sheet resistance drastically decreased due to Cu diffusion in the films. Structure of the films is studied by X-ray diffraction (XRD), while the optical,properties, such as film thickness, refractive index, absorption coefficient and optical band gap have been calculated from the normal transmission spectra in the range 400-2000 nm.