An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures (150, 300 and 450 K). Sputter-depth-profile analyses indicate that the quality of the layering in the Co/Cu/Co structure was only slightly better for the 150 K sample than for the 300 K sample. For the 450 K sample, however, the Co/Cu/Co structure showed extensive disruption. The similarity in the depth-profiles for the 150 and 300 K samples indicates the sensitivity of the GMR to subtle structural differences.