Boron-doped diamond films were grown by hot-filament-assisted chemical vapor deposition (CVD). The fractal dimension (FD) of these films was investigated by atomic force microscope and cyclic voltammetry. The scaling behavior is measured for peak current in cyclic voltammetry, height-height correlations and island size distribution in AFM images. Cyclic voltammetry experiments and the mass-radius (or island distribution) analysis have evidenced FD values lower than two suggesting non-contiguous chemically active sites.