In this work, we introduce jumping mode (JM) scanning force microscopy (SFM) as a suitable technique for imaging soft samples in liquid environment like DNA adsorbed on mica. JM reveals as a non-intrusive technique where shear forces are minimized by performing the scanning motion without tip-sample contact. We find no visible damage on DNA samples and the nominal height of 2 nm of the molecules is achieved when imaging applying a maximum normal force of similar to 150 pN. In addition to topographic images, adhesion maps of DNA are simultaneously recorded showing that the minimum adhesion force occurs on top of the DNA molecules. (C) 2003 Elsevier Science B.V. All rights reserved.