Polycrystalline wafers of silicalite-1 etched by HF acid and viewed by SEM

Brabec L; Kocirik M

Applied Surface Science, Vol.228, No.1-4, 1-4, 2004

DOI10.1016/j.apsusc.2004.01.006 Export Citation

Polycrystalline wafers of silicalite-1 etched by HF acid and viewed by SEM

HF etching of polycrystalline silicalite-1 wafers enables to visualize grain boundaries of non-calcined crystals by dissolution of a phase between individual crystals as well as to reveal resistant shells of calcined crystals by dissolution of a crystal bulk. (C) 2004 Elsevier B.V. All rights reserved.

Keywords:HE etching;grain boundaries visualization;carbon residue