Hematite thin films were prepared by spraying ethanolic solution of ferric trichloride and have been characterized by using Fourier transform infra-red (FT-IR) and X-ray photoelectron spectroscopic (XPS) techniques. The film prepared by spray consists of a single phase of alpha-Fe2O3. The XPS studies confirm that chemical states of Fe3+ and O2- in the film; thereby confirming the formation of the hematite thin films. The photoelectrochemical (PEC) studies have been carried out by forming a three-electrode system using 1 M NaOH electrolyte. The junction is illuminated with white light to obtain I-V characteristics in chopped light. The studies indicate the films exhibit n-type conductivity. (c) 2005 Elsevier B.V. All rights reserved.