Applied Surface Science, Vol.253, No.1, 138-144, 2006
Nanophotonics and nanometrology with planar X-ray waveguide-resonator
The mechanism of X-ray waveguide-resonance propagation or the radiation superstream model, which can become the ground of X-ray nanophotonics, is discussed briefly. Some attention is devoted to features consideration of the simplest devices characterized by the waveguide-resonance transportation of X-ray beams. The experimental data showing the user possibilities of a simplest waveguide-resonators application for diffractometry are presented. We discuss the main reasons to improve the metrological characteristics for total reflection X-ray fluorescence (TXRF) analytical method in case when the target exciting beam is formed by a waveguide-resonator. Some problems appearing during the waveguide-resonator application are formulated. (c) 2006 Elsevier B.V All rights reserved.
Keywords:interference field of X-ray standing wave;total reflection X-ray fluorescence (TXRF);planar X-ray waveguide-resonator (PXWR)