The formation of perpendicular to c texture of WS2 thin films by solid state reaction between the spray deposited WO3 and gaseous sulfur vapours with Ni interfacial layer has been reported. X-ray diffraction technique has been used to measure the degree of preferred orientation and texture of WS2 films. Scanning electron microscopy, transmission electron microscopy and atomic force microscopy have been used to characterize the microstructure and morphology. The electronic structure and chemical composition was studied using X-ray photoelectron spectroscopy. The WS, films comprise single crystalline quality hexagonal crystallites of 15 mu m x 15 mu m size with their basal planes parallel to the substrate. The film consists of turbostratic stacking sequence of 2H and 3R polytypes of WS2. The tungsten-to-sulfur ratio was estimated to be 1:1.8. The various qualitative models used to explain promotional effects are briefly outlined and the plausible underlying mechanism of formation of perpendicular to c texture with nickel, in this study, is given. (c) 2006 Elsevier B.V. All rights reserved.