Previous Article Next Article Table of Contents Advanced Materials, Vol.6, No.4, 303-307, 1994 DOI10.1002/adma.19940060411 Export Citation SCANNING FORCE MICROSCOPY ON SILVER ISLAND FILMS - CORRELATION BETWEEN PARTICLE GEOMETRY AND OPTICAL-PROPERTIES SCHIMMEL T, BINGLER HG, FRANZKE D, WOKAUN A Please enable JavaScript to view the comments powered by Disqus.
