화학공학소재연구정보센터
Advanced Materials, Vol.7, No.6, 549-551, 1995
CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY
The chemical imaging of surfaces with high lateral resolution (i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM.