Advanced Materials, Vol.9, No.11, 861-876, 1997
Dopant electromigration in semiconductors
Dopant diffusion and drift in semiconductors is reviewed with special emphasis on those materials in which semiconductivity is preserved when the dopant concentration changes and ambipolar behavior can be obtained by dopant mobility. The Figure is a schematic representation of the electromigration process in CuInSe2 upon application of an electric field.