Previous Article Next Article Table of Contents Advanced Materials, Vol.13, No.5, 310-313, 2001 DOI10.1002/1521-4095(200103)13:5<310::AID-ADMA310>3.0.CO;2-C Export Citation Force modulation atomic force microscopy as a powerful tool in organic-inorganic hybrid materials analysis Schiavon G, Kuchler JG, Corain B, Hiller W Please enable JavaScript to view the comments powered by Disqus.
