A method was developed for fabricating the tips with double tunneling (DTT) which is based on the successive electrodeposition of polyaniline films and Cu or Tl2O3 clusters on a Pt-Ir-tip-ultramicroelectrode (UME). Specific features of Cu crystallization and STM behaviour of modified tips demonstrate continuity of the polymer film. The presence of junctions metal/insulator/metal (semiconductor) at the end of the prepared tip is also proved by STM experiments.