Pt microwire atomic force microscope (AFM) probes have been employed to characterize the electrical and topographical properties of a Ti/TiO2/Pt anode. The anode consisted of supported Pt metal microparticles in a porous Ti/TiO2 film. Pt microwire probes were found to be more reliable than Pt-coated Si3N4 tips for conductivity mapping in contact mode. Preliminary results revealed a marked spatial heterogeneity in the current-voltage characteristics of the Pt microdeposits, attributed to the nature of the subsurface Pt contact to the underlying Ti/TiO2 substrate. Prospects for using conducting-AFM more widely to characterize the local electrical properties of complex electrode materials are highlighted.