Current Applied Physics, Vol.4, No.6, 615-617, 2004
Soft x-ray magnetic circular dichroism of Cr-doped GaN
Soft X-ray magnetic circular dichroism (XMCD) have been measured for the Ga0.97Cr0.03N film grown by NH3-assisted molecular beam epitaxy. Temperature dependence of the XMCD intensity was well described by the Curie-Weiss law. Although the sample showed ferromagnetic behavior at least up to room temperature, the ferromagnetic component could not be detected by the XMCD measurement. (C) 2004 Elsevier B.V. All rights reserved.