Experimental analysis of the dynamic characteristics of various silicon-cont rolled rectifier (SCR)-type ESD protection circuits at various temperatures has been carried out. These circuits include MOSFET-trigger SCR (MTSCR), diode-chain-trigger SCR (DCTSCR), low-voltage zener diode trigger SCR (ZDSCR), low-voltage trigger SCR (LVTSCR) and gate-coupled low-voltage trigger SCR (GCSCR) circuits. The static trigger voltage increases with temperature if the SCR uses the breakdown trigger mechanism, otherwise it decreases with temperature. The peak pad voltages for the MTSCR and DCTSCR subjected to a pulse-like ESD stress decrease with increasing temperature, while those of GCSCR and LVTSCR are relatively insensitive to temperature.