Previous Article Next Article Table of Contents Solid-State Electronics, Vol.50, No.11-12, 1673-1676, 2006 DOI10.1016/j.sse.2006.09.019 Export Citation Thin film SOIHBT: A study of the effect of substrate bias on the electrical characteristics Fregonese S, Avenier G, Maneux C, Chantre A, Zimmer T Please enable JavaScript to view the comments powered by Disqus.
