FexNi100-x thin films were produced by galvanostatic electrodeposition on Si (1 0 0), nominal thickness 2800 nm, and chi ranging 7-20. The crystalline structure of the sample was determined by X-ray diffraction (XRD). The magnetic properties were investigated by vibration sample magnetometry (VSM) and room temperature Fe-57 Mossbauer spectroscopy. Conversion Electron Mossbauer spectroscopy (CEMS) in both film surfaces for the thick self-supported films showed that the magnetic moment direction is in the plane and conventional transmission (MS) that the directions are out of the plane films. The results were interpreted assuming a three-layer model where the external layer has in-plane magnetization and the internal one, out of plane magnetization. (C) 2007 Elsevier B.V. All rights reserved.