The finite difference method is used to simulate chronoamperometry, linear sweep voltammetry, and cyclic voltammetry at conical electrodes and microelectrodes. Techniques for the numerical simulation of these processes at microdiscs are adapted and extended to accurately model diffusion to the electroactive cone surface. Simulated results are analyzed, and trends are rationalized in terms of the cone apex angle, a. The diffusion domain approximation is used to extend the theory to regular and random arrays of conical electrodes.