Dependence of approaching velocity on the force-distance curve in AFM analysis

Younghun Kim; Young In Yang; Inhee Choi; Jongheop Yi

Korean Journal of Chemical Engineering, Vol.27, No.1, 324-327, January, 2010

DOI10.1007/s11814-009-0314-4 Export Citation

Dependence of approaching velocity on the force-distance curve in AFM analysis

Younghun Kim^†, Young In Yang¹, Inhee Choi¹, and Jongheop Yi¹

Department of Chemical Engineering, Kwangwoon University, Seoul 139-701, Korea
¹School of Chemical & Biological Engineering, Seoul National University, Seoul 151-742, Korea

E-mail:

The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of Vz on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a Vz of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under Vz of 1 μm/s or use of a short/stiff cantilever.

Keywords:AFM;Image Disrotion;Force-distance Curve

[References]

Ansari SG, Dar MA, Kim YS, Seo HK, Kim GS, Wahab R, Ansari ZA, Seo JM, Shin HS, Korean J. Chem. Eng., 25(3), 593 (2008)
Kim Y, Kang SK, Choi I, Lee J, Yi JH, J. Am. Chem. Soc., 127(26), 9380 (2005)
Kim Y, Choi I, Kang SK, Lee J, Yi J, Appl. Phys. Lett., 86, 073113 (2005)
Cappella B, Dietler G, Surf. Sci. Rep., 34, 1 (1999)
Heinrich V, Leung A, Evans E, J. Chem. Inf. Model., 45, 1482 (2005)
Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 110(32), 15963 (2006)
Yiapanis G, Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 111, 6465 (2007)
Carpick RW, Ogletree DF, Salmeron M, J. Colloid Interface Sci., 211(2), 395 (1999)
Kwon J, Honh J, Kim YS, Lee DY, Lee S, Park S, Rev. Sci. Instrum., 74, 4378 (2003)
Kim Y, Yi J, J. Phys. Chem. B, 110(41), 20526 (2006)
Wojcikiewicz EP, Abdulreda MH, Zhang XH, Moy VT, Biomacromolecules, 7(11), 3188 (2006)
Kim H, Arakawa H, Hatae N, Sugimoto Y, Matsumoto O, Psada T, Ichikawa A, Ikai A, Ultramicroscopy, 106, 652 (2006)
Jones RE, Hart DP, Tribol. Int., 38, 335 (2005)
Argento C, French RH, J. Appl. Phys., 80, 6081 (1996)
Drelich J, Xu ZH, Masliyah J, Langmuir, 22(21), 8850 (2006)
Christenson HK, J. Phys. Chem., 97, 12034 (1993)

[Related Articles]

[1] Ansari SG, Dar MA, Kim YS, Seo HK, Kim GS, Wahab R, Ansari ZA, Seo JM, Shin HS, Korean J. Chem. Eng., 25(3), 593 (2008)

[2] Kim Y, Kang SK, Choi I, Lee J, Yi JH, J. Am. Chem. Soc., 127(26), 9380 (2005)

[3] Kim Y, Choi I, Kang SK, Lee J, Yi J, Appl. Phys. Lett., 86, 073113 (2005)

[4] Cappella B, Dietler G, Surf. Sci. Rep., 34, 1 (1999)

[5] Heinrich V, Leung A, Evans E, J. Chem. Inf. Model., 45, 1482 (2005)

[6] Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 110(32), 15963 (2006)

[7] Yiapanis G, Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 111, 6465 (2007)

[8] Carpick RW, Ogletree DF, Salmeron M, J. Colloid Interface Sci., 211(2), 395 (1999)

[9] Kwon J, Honh J, Kim YS, Lee DY, Lee S, Park S, Rev. Sci. Instrum., 74, 4378 (2003)

[10] Kim Y, Yi J, J. Phys. Chem. B, 110(41), 20526 (2006)

[11] Wojcikiewicz EP, Abdulreda MH, Zhang XH, Moy VT, Biomacromolecules, 7(11), 3188 (2006)

[12] Kim H, Arakawa H, Hatae N, Sugimoto Y, Matsumoto O, Psada T, Ichikawa A, Ikai A, Ultramicroscopy, 106, 652 (2006)

[13] Jones RE, Hart DP, Tribol. Int., 38, 335 (2005)

[14] Argento C, French RH, J. Appl. Phys., 80, 6081 (1996)

[15] Drelich J, Xu ZH, Masliyah J, Langmuir, 22(21), 8850 (2006)

[16] Christenson HK, J. Phys. Chem., 97, 12034 (1993)