2 pi steradian Si 2p photoelectron pattern from Si(0 0 1) surface was measured. The circular dichroism of rotational shift around the incident-light axis was observed. Shifts for the forward focusing peaks in {111} and {0 1 1} directions were inversely proportional to the distance between the emitter atom and neighboring atoms in {111} and {011} directions, respectively. These shifts correspond to the parallax in stereograph of the atomic arrangements. On the other hand, such rotational shifts were not observed in {11 2} directions due to the first order diffraction rings around {11 0} directions. A gross feature of Si 2p photoelectron pattern can be explained by forward focusing peaks and first order diffraction rings around them. (c) 2008 Elsevier B.V. All rights reserved.