Study of buried Si(111)-5x2-Au by surface X-ray diffraction

Iwasawa Y; Voegeli W; Shirasawa T; Sekiguchi K; Nojima T; Yoshida R; Takahashi T; Matsumoto M; Okano T; Akimoto K; Kawata H; Sugiyama H

Applied Surface Science, Vol.254, No.23, 7803-7806, 2008

DOI10.1016/j.apsusc.2008.02.129 Export Citation

Study of buried Si(111)-5x2-Au by surface X-ray diffraction

Iwasawa Y, Voegeli W, Shirasawa T, Sekiguchi K, Nojima T, Yoshida R, Takahashi T, Matsumoto M, Okano T, Akimoto K, Kawata H, Sugiyama H

The structure of buried Si(1 1 1)-5 x 2-Au capped with amorphous Si was investigated using surface Xray diffraction. It was found that the 5 x 2 structural periodicity is kept under the amorphous Si from the in-plane measurement. Furthermore, the intensity variation along the fractional-order rod indicates that Au atoms are located almost on the same plane. (C) 2008 Elsevier B.V. All rights reserved.

Keywords:Si(111)-5 x 2-Au;surface X-ray diffraction;buried interface