Applied Surface Science, Vol.255, No.3, 715-717, 2008
Interconnection effects on the performance of basic subcircuits with single-electron tunneling devices
Interconnection limits seem to be a potential problem to the evolution of the semiconductor industry, especially in the nanoscale. In this work, the electrical performance of basic cells is studied with the help of a simple interconnection model, whose parameters can be changed. Our goal, with this study, is to determine the interconnection's influence upon the circuit behavior and to establish interconnection-related limits for its functionality. An extrapolation to more complex circuit topologies is also discussed. Finally, the implementation possibilities using new interconnection technologies, like carbon nanotubes, are presented. (c) 2008 Elsevier B.V. All rights reserved.