The Storing Matter technique has been developed recently in SAM to perform quantitative analyses with high sensitivity: the sample to be analysed is sputtered by ion bombardment and up to a sub-monolayer of emitted particles is deposited on a collector. In the present work, this collector is subsequently analysed by static Secondary Ion Mass Spectrometry (SIMS). We concentrate on the conservation of the molecular information throughout the deposition and analysis processes. The experiments are realised on PS and PVC films. The deposits have been clearly identified on the collector. The molecular information is partially conserved throughout the deposition and analysis processes. Higher fragmentation in the mass spectra of the collectors is due to double fragmentation in the sputter-deposition and analysis steps. (c) 2008 Elsevier B.V. All rights reserved.