Atomic force microscopy (AFM) and luminescence methods (galvanoluminescence and photoluminescence) were used to characterize porous oxide films obtained by aluminum anodization in sulfamic acid solution. For the first time we measured weak galvanoluminescence during aluminum anodization in sulfamic acid and found strong influence of sample's surface pretreatment as well as anodic conditions on luminescence intensity. AFM analysis showed that the pore arrangement of porous oxide films formed in sulfamic acid by two-step anodization process at a constant voltage of 15-30 V is relatively irregular. (C) 2008 Elsevier B.V. All rights reserved.