(1 - x)Pb(Mg1/3Nb2/3)O-3-xPbTiO(3) (PMN-PT) thin films have been deposited on quartz substrates using pulsed laser deposition (PLD). Crystalline microstructure of the deposited PMN-PT thin films has been investigated with X-ray diffraction (XRD). Optical transmission spectroscopy and Raman spectroscopy are used to characterize optical properties of the deposited PMN-PT thin films. The results show that the PMN-PT thin films of perovskite structure have been formed, and the crystalline and optical properties of the PMN-PT thin films can be improved as increasing the annealing temperature to 750 degrees C, but further increasing the annealing temperature to 950 degrees C may lead to a degradation of the crystallinity and the optical properties of the PMN-PT thin films. In addition, a weak second harmonic intensity (SHG) has been observed for the PMN-PT thin film formed at the optimum annealing temperature of 750 degrees C according to Maker fringe method. All these suggest that the annealing temperature has significant effect on the structural and optical properties of the PMN-PT thin films. (C) 2009 Elsevier B.V. All rights reserved.