A novel method of deducing the parameters of electron density profiles pertaining to the theoretical re-construction of X- ray reflectivity data of liquid metals is proposed and the inter-dependence of various parameters of the electron density is indicated. The crucial role played by the diffusion coefficient, viscosity and critical temperature of the metals in dictating the correlation lengths is pointed out. The applicability of the methodology is demonstrated for the experimental data on the X- ray reflectivity of Ga, In and K. (C) 2009 Elsevier B. V. All rights reserved.