화학공학소재연구정보센터
Chemistry Letters, Vol.38, No.1, 58-59, 2009
Ion-selective Imaging by Atomic Force Microscopy with a Crown-ether-modified Tip
Ion-selective surface imaging was successfully attained by atomic force microscopy with a probe tip functionalized with a 15-crown-5 derivative. The frictional force images for nanopatterned substrates revealed enhanced contrasts attributable to the cation-binding interaction between the 15-crown-5 on the tip and potassium ions on the substrate.