In this study, the effect of measurement temperature and uniaxial drawing on the real (dielectric constant, stant, epsilon' and imaginary (loss index, epsilon '') parts of the complex dielectric constant of alpha-crystalline phase poly(vinylidene fluoride) (PVDF) was investigated. The samples having different draw ratios (lambda) were obtained by drawing the PVDF film at constant speed and temperature. The dielectric measurements were performed in the frequency range of 100 Hz-1 MHz and in the temperature range of 80-400 K. Although epsilon' and epsilon '' were not affected by the orientation process during the beta-relaxation transition, it was observed that there were systematical variations for the a-relaxation transition. epsilon' and epsilon '' showed different behaviors depending on the draw ratio at different temperatures. Especially, epsilon '' was more affected by the orientation process at 380 K. (C) 2009 Wiley Periodicals, Inc. J Appl Polym Sci 112: 2482-2485, 2009