화학공학소재연구정보센터
Journal of Crystal Growth, Vol.311, No.8, 2367-2371, 2009
Comparative study of HgxCd1-xTe films grown on CdTe thin films previously deposited from two different techniques
High quality cadmium telluride (CdTe) thin films were grown on glass substrates with two different techniques, two evaporation source (TES) and closed space sublimation (CSS). Further to the above mercury telluride (HgTe) was then deposited by using single source on both CdTe thin films for obtaining HgxCdt-xTe samples. The crystalline structure of the HgxCd1-xTe sample grown from CSS-CdTe showed the preferential (1 1 1) orientation with smoother and larger grain size than those of TES-CdTe. The optical transmission for TES-CdTe sample was above 90% in the 1000-1500 nm range whereas it was significantly below 80% for CSS-CdTe sample. The optical transmission for TES-HgxCd1-xTe and CSS-HgxCd1-xTe was similar to 60%. The resistivity at room temperature of TES-CdTe and CSS-CdTe was similar to 3.33 x 10(9) Omega cm and similar to 2.20 x 10(8) Omega cm, respectively, while the resistivity of TES-HgxCd1-xTe and CSS-HgxCd1-xTe samples was similar to 1.73 Omega cm and similar to 5.34 x 10(5) Omega cm, respectively. The comparative study of ternary compound prepared with the above techniques has been carried out for the first time. (C) 2009 Elsevier B.V. All rights reserved.