We have investigated the electrophysical properties of metallic thin films based on Cu/Cr and Fe/Cr systems. We find that the longitudinal gauge factor of two-layer films is significantly greater as compared with one-layer films, which have the same thickness as the total thickness of a two-layer film. Interface and intensive grain-boundary electron scattering explain such an increase in the longitudinal gauge factor. We find that the longitudinal gauge factor increases in transition from elastic to plastic zone.