- Previous Article
- Next Article
- Table of Contents
Journal of Vacuum Science & Technology B, Vol.28, No.1, 216-216, 2010
Characterization of focused-ion-beam induced defect structures in graphite for the future guided self-assembly of molecules (vol 27, pg 2209, 2009)
Keywords:crystal defects;graphite;ion beam effects;Monte Carlo methods;scanning tunnelling microscopy;self-assembly