화학공학소재연구정보센터
Applied Surface Science, Vol.256, No.21, 6403-6407, 2010
Characterization of diamond-like carbon films by SEM, XRD and Raman spectroscopy
Diamond-like carbon films were deposited by electrolysis of a water-ethanol solution on Cu at low voltages (60-100 V) at 2 mm interelectrode separation. The films were characterized by scanning electron microscopy (SEM), X-ray diffractometer (XRD) and Raman spectroscopy. The films were found to be continuous and compact with uniform grain distribution. Raman spectroscopy analysis revealed two broad bands at similar to 1350 and similar to 1580 cm(-1). The downshift of the G band of graphite is indicative of the presence of DLC. For XRD analysis, the three strong peaks located at 2 theta values of 43.2 degrees, 74.06 degrees and 89.9 degrees can be identified with reflections form (1 1 1), (2 2 0) and (3 1 1) plane of diamond. (C) 2010 Elsevier B. V. All rights reserved.