A new tomography technique for imaging 3D nanometer-scale material features in mm(3) volumes has been developed. The technique employs a femtosecond laser for layer-by-layer material removal at rates 4-5 orders of magnitude faster than comparable serial sectioning techniques. The technique can be applied to a wide range of multiphase materials and an example of its application for imaging of TiN particles inhomogeneously dispersed in a metallic matrix is given.