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2 |
Comparative Study on the Electrical Characteristics between Gate-First and Gate-Last Like Processed MOS Devices Hoon Hee Han, Donghwan Lim, Yu-Rim Jeon, Jae Ho Lee, Changhwan Choi 한국재료학회 2017년 봄 학술대회 |
1 |
Nano-Scaled Silver Metal Cross Array Fabrication Using Nano-Imprint Lithography on the PET Substrate Yu-Rim Jeon, Young In Gil, Donghwan Lim, Hoon Hee Han, Changhwan Choi 한국재료학회 2017년 봄 학술대회 |