| 학회 |
한국고분자학회 |
| 학술대회 |
2007년 가을 (10/11 ~ 10/12, 일산킨텍스) |
| 권호 |
32권 2호 |
| 발표분야 |
나노구조제어 및 분석기술 |
| 제목 |
X-ray Imaging for Materials and Biomedical Sciences |
| 초록 |
In recent years, radiology has been literally revolutionized by the exploitation of the unique characteristics of synchrotron sources with high spatial coherence. The results are very high quality microradiology and microtomograhy images and movies - taken with a limited x-ray dose – that find a variety of applications in materials science, biology and medical research. In this talk we review basic theory and selected applications of phase contrast x-ray microscopy to polymer, semiconductor, and biomedical sciences. Furthermore we introduce a new strategy of combining phase contrast radiology and diffraction x-ray microscopy to visualize atomic level defects such as misfit dislocations and micropipes in semiconductor single crystals. The forthcoming improvements in phase contrast x-ray imaging will lead to even better imaging of many different phenomena at the nanometer level in materials and biomedical sciences. |
| 저자 |
J.M. Yi1, S.K. Seol2, B.M. Weon3, K.H. Lee1, J.H. Je2
|
| 소속 |
1X-ray Imaging Center, 2POSTECH, 3Korea |
| 키워드 |
ㅁX-ray Imaging; Synchrotron Radiation
|
| E-Mail |
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