| 학회 | 한국화학공학회 |
| 학술대회 | 2003년 봄 (04/25 ~ 04/26, 순천대학교) |
| 권호 | 9권 1호, p.170 |
| 발표분야 | 공업화학 |
| 제목 | Determining the thickness and dielectric constant of conducting polymer thin-film by surface plasmon resonance spectroscopy |
| 초록 | The evaluation of dielectric constant and thickness of conducting polymer thin-film is very important area in electronic applications. Surface plasmon resonance (SPR) is a well known optical method to determine optical constants such as refractive index related to dielectric constant, extinction coefficient , and thickness. Optical constants can be determined easily by mathematical fitting of experimental SPR data with the Fresnel equation. Therefore the SPR is a convenient method to determine dielectric constant and thickness of conducting polymer thin-film simultaneously. We used Poly[4,4’-bis(triisopropylsiloxy) methyl-1,6-heptadiyne-co-(diethyldipropargylmalonate)] as a conducting polymer and details of SPR investigation and calculated results to determine dielectric constant and thickness will be included in the presentation. |
| 저자 | 박건욱, 고광락 |
| 소속 | 경북대 |
| 키워드 | Dielectric Constant; Thickness; Conducting Polymer; Surface Plasmon Resonance |
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