| 초록 |
The neutron/X-ray reflectivity techniques have been used to investigate the interfacial structure of organic/inorganic thin films and membrane materials. In this presentation, I will introduce examples of application of reflectivity technology in electronic devices based on organic thin films and the desalination membranes for water treatment processes. In both cases, the interfacial structure of the thin films significantly affects the performance of nanoelectronics and desalination membranes. The neutron/X-ray reflectivity technique is the only way to non-destructively measure the structure of thin films and membranes at the nanoscale by in-situ measurement. In this regard, this technology can be used as an important tool in the development of electronic materials (such as, battery anode materials, organic transistors, and solar cells), and environmental materials (related to gas barrier, seawater desalination membrane, and heavy metal / radioactive material adsorption). |
