| 학회 | 한국재료학회 |
| 학술대회 | 2006년 봄 (05/19 ~ 05/20, 경상대학교 ) |
| 권호 | 12권 1호 |
| 발표분야 | 전자재료 |
| 제목 | 양전자 소멸 측정법을 이용한 영상 형광체의 결함 연구 |
| 초록 | We present a simple, high-performance coincidence Doppler broadening spectrometer for positron annihilation experiment(CDBPAS). We used DBPAS and CDBPAS to measure the concentration, spatial distribution, and size of open volume defects in the rare-earth intensifying screen materials. The intensifying screens in the hospital were exposed by X-ray varying the 0, 2, 4, and 6 years, respectively and also irradiated by 37 MeV proton beams ranging from 0 to 1012 ptls. The S-parameter values were increased as increasing the exposed period, that indicated the defects generate more. The S-parameters of the samples with X-rays are varied from 0.49 to 0.51. |
| 저자 | 이종용1, 김재홍2, 전권수2 |
| 소속 | 1한남대, 2한국원자력의학원 RI 및 방사성의약품개발실 |
| 키워드 | 양전자; 소멸분광 측정; 동시계수도플러; |
