| 초록 |
The thermal reduction of graphene oxide (GO) for films and powders at room temperature (RT) to 2000°C, along with the resultant graphenes, was investigated using X-ray diffraction and other analytical methods. The thermal GO reduction process is very complex, with six critical temperature zones: RT-130°, 140-180°C, 180-600°C, 600-800°C, 800-1000°C, and 1000-2000°C, related to the vaporization of intercalated H2O molecules, stepwise removal of oxide groups, interlayer contraction and layer exfoliation, defect formation, lattice relaxation, folding and unfolding processes, and bottom-up layer stacking toward bulk graphite. These phenomena are well summarized and explained in this research examination. |
