| 학회 |
한국재료학회 |
| 학술대회 |
2017년 가을 (11/15 ~ 11/17, 경주 현대호텔) |
| 권호 |
23권 2호 |
| 발표분야 |
G. 나노/박막 재료 분과 |
| 제목 |
A reliable and high spatial resolution method to identify the number of graphene layers using a scanning electron microscopy |
| 초록 |
The journey of graphene from 2004 is still going on in ascending order in content with fundamental studies and practical applications. For commercializing graphene in a variety of industrial sectors, understanding of physical and electronic properties are essential because they are highly related to the thickness, i.e. the number of graphene layers. Here, we report a scanning electron microscopy technique that provides a high spatial resolution image at low operating voltages of ＜ 5 kV make it more reliable to identify the number of graphene layers. There is a linear relationship between the relative electron intensity and the number of graphene layers, enabling to characterize the number of graphene layers. The number of layers is also verified by an atomic force microscopy and Raman spectroscopy. With this linear relationship, we can identify the number of graphene layers for an unknown graphene sample easily, rapidly, spatially, accurately and in a non-destructive manner. This technique is applicable to characterize nanometer size other 2D materials that are too small to be observed using optical methods. |
| 저자 |
Rakesh Sadanand Sharbidre1, 이창준2, 박병천2, 홍성구2, 김택남1
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| 소속 |
1배재대, 2한국표준과학(연) |
| 키워드 |
Graphene; Number of layers; Scanning electron microscopy; Contrast difference
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| E-Mail |
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