| 학회 |
한국화학공학회 |
| 학술대회 |
2004년 가을 (10/29 ~ 10/30, 호서대학교(아산캠퍼스)) |
| 권호 |
10권 2호, p.2001 |
| 발표분야 |
이동현상 |
| 제목 |
Nano-Scale Measurements of Long-Range Interactions in Microfluidic Channel Using AFM with Colloidal Particle Probe |
| 초록 |
Long-range interactions are important to understand the physicochemical phenomena of electric field in either micro-biochip or MEMS devices confined to the charged solid wall and to analyze the behavior of complex fluids dispersed by either colloids or nano-particles. Atomic force microscopy (AFM) results were obtained for electrostatic interaction force profiles between a silicon nitride tip and a silica surface by the traditional method as well as between a spherical silica particle and a silica surface employing a colloid probe technique. Distances ranging several tens of nanometers were successfully measured under a contact mode in 1.0 mM KCl electrolyte solution at different pH values. Experimental results obtained by the colloid probe were compared with the calculations from Derjaguin approximation as well as rigorous numerical method. As the separation distance between the silica surface and silica particle is decreased, the approximation under constant potential gives greater interaction than our measured values, with its difference becoming large. AFM results in PDMS-based microfluidic channel are also presented. |
| 저자 |
전명석1, R.W. Lovitt2, W.R. Bowen3
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| 소속 |
1한국과학기술(연), 2Centre for Complex Fluids Processing, 3U. of Wales |
| 키워드 |
Atomic Force Microscope; Colloid Probe; Electrostatic Interaction Force; Microfluidic Channel; Derjaguin Approximation; Silica
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| E-Mail |
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| 원문파일 |
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