| 학회 |
한국고분자학회 |
| 학술대회 |
2002년 봄 (04/12 ~ 04/13, 서울대학교) |
| 권호 |
27권 1호, p.48 |
| 발표분야 |
분자전자 부문위원회 |
| 제목 |
Surface Order in Polyfluorene Films from NEXAFS Experiments |
| 초록 |
Polyfluorene derivatives have been intensively studied recently owing to their electroluminescent properties. We have used soft X-ray absorption spectroscopy, in particular, the NEXAFS spectroscopy, to investigate their surface structures. NEXAFS signal originates from the near-surface region of the sample and combination of the Auger electron yield (AEY) and total electron yield (TEY) provides sampling depths of about 10 and 100? respectively. Our NEXAFS measurements with surface sensitivity and polarization dependence clearly reveal a preferential in-plane molecular orientation and phenyl groups of polyfluorenes at the surfaces. Moreover, this surface orientation is found to increase significantly upon annealing at high temperatures. |
| 저자 |
정영석1, 조태연2, J. Luning*3, H.-G. Nothofer**, U. Scherf**, 윤도영
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| 소속 |
1서울대, 2*Stanford Synchrotron Radiation Laboratory, 3**Max-Planck-Institute for Polymer Research |
| 키워드 |
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| E-Mail |
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| VOD |
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