| 초록 |
A near-field scanning microscopy (NSOM) technique that utilizes the extreme local field enhancement at the apex of an externally-illuminated metallic antenna probe will be discussed. The resolution of this tip-enhanced or apertureless NSOM (ANSOM) is only limited by the radius of curvature of the probe, and therefore it promises unprecedented optical resolution (＜ 20 nm) for materials science and nanoscicence applications. However, the potential and limitation of this technique has not been extensively explored thus far. I will discuss (1) the present status of the ANSOM, our own effort for the development of the apertureless NSOM techniques for dielectric, and plasmonic, and vibrational chemical imaging of metallic and semiconductor nanostructures, and (3) near-future prospects for the application of this new nano-optical technique. |
