화학공학소재연구정보센터
학회 한국고분자학회
학술대회 2021년 봄 (04/07 ~ 04/09, 대전컨벤션센터)
권호 46권 1호
발표분야 기능성 고분자
제목 Fabrication of Functional Atomic Force Microscopy Probe for Reversed Dip-Pen Nanolithography.
초록 Atomic force microscopy (AFM) is useful equipment that can analyze the surface of a sample from microscale to nanoscale. Fabricated functional AFM probe is available for various applications. Boron nitride nanotubes (BNNTs) have similar tubular nanostructure as carbon nanotube (CNT) in which boron and nitrogen atoms arranged in a hexagonal network. BNNTs has properties that can replace CNT. Zinc oxide (ZnO) nanowires have single crystalline and exhibit a hexagonal wurtzite structure. ZnO is also applied as biosensing and photocatalyst. In this study, we coated seed on AFM probe via reversed dip-pen nanolithography (DPN). Through the chemical vapor deposition (CVD) process, we grew BNNTs at the end of the AFM probe where the catalyst was coated. Coating ZnO seeds to AFM probe and growing ZnO nanowires via annealing. All analyses were performed using atomic force microscopy, muffle furnace for chemical vapor deposition, scanning electron microscope (SEM).
저자 황태순, 곽효빈, 김경민, 임정혁
소속 한국교통대
키워드 AFM; Reversed DPN; ZnO; BNNT
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